Issued Patents 2018
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10082385 | System for measuring displacement of accelerating tube in high-vacuum chamber by using micro-alignment telescope and method thereof | Min Ki Lee, Young Kwon Kim, Yong-Woo Jo, Jong Wan Choi, Woo-Kang Kim | 2018-09-25 |
| 10060859 | Method of inspecting foreign substance on substrate | Hyun Seok Lee, Jae-Sik Yang, Ja-Geun Kim, Hee-Wook You | 2018-08-28 |
| 9885669 | Method of inspecting a substrate | Soo Young Cho, Hee-Wook You, Bong-Ha Hwang | 2018-02-06 |