Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9991174 | Method and system of measuring semiconductor device and method of fabricating semiconductor device using the same | Choonshik Leem, Jihye Lee, Soobok Chin | 2018-06-05 |
DK
Deokyong Kim
Overall (2018): #437,639 of 503,207Top 90%
1
Patents 2018