Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10119811 | Alignment mark, method of measuring wafer alignment, and method of manufacturing a semiconductor device using the method of measuring wafer alignment | Seung Yoon Lee, Jeong Jin Lee | 2018-11-06 |
| 9958495 | Computing device executing program performing method of analyzing power noise in semiconductor device, semiconductor device design method, and program storage medium storing program | Young-Hoe Cheon | 2018-05-01 |