Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10127740 | Inspection apparatus, inspection system, and inspection method | Nobuyoshi Morita, Makoto Kayashima, Keisuke Hakuta | 2018-11-13 |
| 10051004 | Evaluation system | Hiroki Uchiyama, Yusuke Fujihara, Makoto Kayashima, Satoshi Ohkubo, Jun Hamanaka | 2018-08-14 |