Issued Patents 2018
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10161887 | Systems and methods for materials analysis | Vasisht Venkatesh, David Ulrich Furrer | 2018-12-25 |
| 9976971 | Systems and methods for X-ray diffraction | David Ulrich Furrer | 2018-05-22 |
| 9939393 | Detection of crystallographic properties in aerospace components | David Ulrich Furrer, Venkatarama K. Seetharaman | 2018-04-10 |