Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10114074 | Systems and methods for wafer-level loopback test | Alvin Leng Sun Loke, Thomas Clark Bryan, Tin Tin Wee, Stephen Knol, LuVerne Ray Peterson | 2018-10-30 |
| 9977078 | Systems and methods for wafer-level loopback test | Alvin Leng Sun Loke, Thomas Clark Bryan, Tin Tin Wee, Stephen Knol, LuVerne Ray Peterson | 2018-05-22 |