Issued Patents 2018
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10119903 | Interferometric ellipsometry and method using conical refraction | Yoel Arieli | 2018-11-06 |
| 10054419 | Method for analyzing an object using a combination of long and short coherence interferometry | Yoel Arieli | 2018-08-21 |
| 10054429 | System for tomography and/or topography measurements of a layered objects | Yoel Arieli | 2018-08-21 |
| 10024650 | System for analyzing optical properties of an object | Yoel Arieli | 2018-07-17 |
| 10024783 | Interferometric ellipsometry and method using conical refraction | Yoel Arieli | 2018-07-17 |