KF

Kazuhiko Fukazawa

NI Nikon: 1 patents #100 of 309Top 35%
📍 Kamakura, JP: #45 of 111 inventorsTop 45%
Overall (2018): #351,829 of 503,207Top 70%
1
Patents 2018

Issued Patents 2018

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9964497 Inspection method, inspection apparatus, exposure control method, exposure system, and semiconductor device 2018-05-08