Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10151705 | Method of generating a compensation matrix during a substrate inspection | Seungwon Jung, Heewook You | 2018-12-11 |
| 9911185 | Method of generating reference data for inspecting a circuit board | Seungwon Jung, Heewook You | 2018-03-06 |