Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10062543 | Determining multi-patterning step overlay error | Ajay Gupta, Thanh Huy Ha, Kumar Raja | 2018-08-28 |
| 9947596 | Range-based real-time scanning electron microscope non-visual binner | Hemanta Kumar Roy, Arpit Jain, Arpit Yati, Arun Lobo | 2018-04-17 |