KW

Kenichi Washio

NM Nihon Micronics: 1 patents #7 of 17Top 45%
Overall (2018): #342,236 of 503,207Top 70%
1
Patents 2018

Issued Patents 2018

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9910089 Inspection unit, probe card, inspection device, and control system for inspection device Norie Yamaguchi 2018-03-06