Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10014153 | Electron microscope and method of aberration measurement | — | 2018-07-03 |
| 9859095 | Electron microscope and measurement method | Naoya Shibata, Hidetaka Sawada | 2018-01-02 |
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10014153 | Electron microscope and method of aberration measurement | — | 2018-07-03 |
| 9859095 | Electron microscope and measurement method | Naoya Shibata, Hidetaka Sawada | 2018-01-02 |