Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9864075 | Integrated reciprocal space mapping for simultaneous lattice parameter refinement using a two-dimensional X-ray detector | — | 2018-01-09 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9864075 | Integrated reciprocal space mapping for simultaneous lattice parameter refinement using a two-dimensional X-ray detector | — | 2018-01-09 |