Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10145863 | Test systems with a probe apparatus and index mechanism | John Dunklee, Bryan J. Root | 2018-12-04 |
| 9910067 | Apparatus and method for terminating probe apparatus of semiconductor wafer | Bryan J. Root | 2018-03-06 |