Issued Patents 2018
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9909991 | Method and system for inspecting indirect bandgap semiconductor structure | Robert Andrew Bardos | 2018-03-06 |
| 9912291 | Method and system for testing indirect bandgap semiconductor devices using luminescence imaging | Robert Andrew Bardos | 2018-03-06 |
| 9885662 | Methods for inspecting semiconductor wafers | Juergen Weber | 2018-02-06 |