Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10062160 | Pattern weakness and strength detection and tracking during a semiconductor device fabrication process | Khurram Zafar, Chenmin Hu, Ye Chen, Yue Ma, Justin Chen +3 more | 2018-08-28 |