Issued Patents 2018
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9869714 | Integrated circuit test temperature control mechanism | John C. Johnson, Abram M. Detofsky, James Neeb | 2018-01-16 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9869714 | Integrated circuit test temperature control mechanism | John C. Johnson, Abram M. Detofsky, James Neeb | 2018-01-16 |