Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10026587 | Sample holder for scanning electron microscopy (SEM) and atomic force microscopy (AFM) | Florentino Leyte Guerrero, Ubaldo Sadott Pacheco y Alcalá, David Velázquez Cruz | 2018-07-17 |