Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9857171 | Measuring probe for non-destructive measuring of the thickness of thin layers | — | 2018-01-02 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9857171 | Measuring probe for non-destructive measuring of the thickness of thin layers | — | 2018-01-02 |