Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10151713 | X-ray reflectometry apparatus for samples with a miniscule measurement area and a thickness in nanometers and method thereof | Yun-San Chien, Wei-En Fu, Shyh-Shin Ferng, Yi-Hung Lin | 2018-12-11 |