Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10008005 | Measurement system and method for measuring multi-dimensions | Yueh-Yi Lai, Zih-Jian Jhang | 2018-06-26 |
| 9958267 | Apparatus and method for dual mode depth measurement | Ludovic Angot, Yi-Heng Chou | 2018-05-01 |