Issued Patents 2018
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10114071 | Testing mechanism for a proximity fail probability of defects across integrated chips | Kirk D. Peterson, Alain G. Rwabukamba | 2018-10-30 |
| 10101388 | Method for enhanced semiconductor product diagnostic fail signature detection | Robert C. Redburn, Jeffrey S. Zimmerman | 2018-10-16 |
| 9921264 | Method and apparatus for offline supported adaptive testing | Hunter Feng Shi | 2018-03-20 |