Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10060970 | Electronic component testing device | Keiichiro Tanaka | 2018-08-28 |
| 9899300 | Semiconductor device | Kenji Fujii, Yasumasa Kasuya, Mamoru Yamagami, Motoharu Haga | 2018-02-20 |