Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9964500 | Defect inspection device, display device, and defect classification device | Koichi Nagoya, Mamoru Kobayashi | 2018-05-08 |
| 9933370 | Inspection apparatus | Masaaki Ito | 2018-04-03 |