Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10094658 | Overlay measurement method, device, and display device | Yuji Takagi, Yasunori Goto | 2018-10-09 |
| 9858659 | Pattern inspecting and measuring device and program | Tsuyoshi Minakawa, Takashi Hiroi, Takeyuki Yoshida, Taku Ninomiya, Takuma Yamamoto +3 more | 2018-01-02 |