Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10147659 | Method and structure for process limiting yield testing | Uwe Dersch, Thomas Merbeth | 2018-12-04 |
| 10048311 | Detection of gate-to-source/drain shorts | Hans-Peter Moll, Uwe Dersch | 2018-08-14 |