Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10078114 | Test point circuit, scan flip-flop for sequential test, semiconductor device and design device | Jun Matsushima | 2018-09-18 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10078114 | Test point circuit, scan flip-flop for sequential test, semiconductor device and design device | Jun Matsushima | 2018-09-18 |