Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9974435 | Quality control method for optometric measurements | Ahmed Haddadi, Marie-Anne Berthezene, Cecile Petignaud, Loic Levraud, Sebastien Gayat +2 more | 2018-05-22 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9974435 | Quality control method for optometric measurements | Ahmed Haddadi, Marie-Anne Berthezene, Cecile Petignaud, Loic Levraud, Sebastien Gayat +2 more | 2018-05-22 |