Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9891041 | Apparatus and method for measuring thickness of transparent and/or translucent mediums using a reflecting signal that is normal or near normal to the mediums | Jed Martens, Mark A. Imbrock, Jeffrey A. Simpson | 2018-02-13 |