Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10031109 | Optoacoustic inspection device for inspection of semiconductor wafers | Chanel Moira Pia Hayden, Patrick McNally | 2018-07-24 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10031109 | Optoacoustic inspection device for inspection of semiconductor wafers | Chanel Moira Pia Hayden, Patrick McNally | 2018-07-24 |