Issued Patents 2018
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10073004 | DOE defect monitoring utilizing total internal reflection | Meng Zhang | 2018-09-11 |
| 9970845 | Interrogating DOE integrity by reverse illumination | Denis G. Chen, Chin Han Lin | 2018-05-15 |
BM
Brian S. Medower
Overall (2018): #162,603 of 503,207Top 35%
2
Patents 2018