Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9953407 | Wafer inspection method and wafer inspection apparatus | Yusaku Ito, Tomoyuki Yaguchi | 2018-04-24 |
| 9881828 | Wafer processing method | Shinji Yoshida, Yusaku Ito | 2018-01-30 |