Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10032167 | Abnormal pattern analysis method, abnormal pattern analysis apparatus performing the same and storage medium storing the same | Hae Yong YUN, Kang Hee Lee, Ki Hyun Cho | 2018-07-24 |