Issued Patents 2018
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10068858 | Compound semiconductor substrate | Kenichi Eriguchi, Noriko Omori, Hiroshi Oishi, Jun Komiyama | 2018-09-04 |
| 9976905 | Surface characteristic measurement device | Yosuke Takebe | 2018-05-22 |
| 9885668 | Surface inspection device, surface inspection method, and program | Takafumi Komatsu, Wataru Yamaguchi, Yosuke Takebe | 2018-02-06 |