Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10073038 | Glow discharge spectroscopy method and system for measuring in situ the etch depth of a sample | Simon Richard, Olivier Acher, Patrick Chapon | 2018-09-11 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10073038 | Glow discharge spectroscopy method and system for measuring in situ the etch depth of a sample | Simon Richard, Olivier Acher, Patrick Chapon | 2018-09-11 |