Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10115013 | Method and apparatus for single-particle localization using wavelet analysis | — | 2018-10-30 |
| 10031326 | System and method of edge-illumination microscopy | Xavier Levecq, Virgile Viasnoff, Vincent Studer, Rémi Galland | 2018-07-24 |