Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9893131 | Test element group, method of testing electrical characteristics of semiconductor elements, and fabricating method thereof | Shuai Zhang | 2018-02-13 |
| 9893165 | Method for manufacturing array substrate and manufacturing device | Jianbang Huang, Chienhung Liu | 2018-02-13 |