Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10126659 | Method and apparatus for inspection and metrology | Ferry Zijp, Sietse Thijmen Van Der Post, Fanhe Kong | 2018-11-13 |
| 9927722 | Method and apparatus for inspection and metrology | Koos Van Berkel, Jeroen Johan Maarten Van De Wijdeven, Ferry Zijp | 2018-03-27 |