Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10156796 | Method for determining the parameters of an IC manufacturing process by a differential procedure | Mohamed Saib, Patrick J. Schiavone | 2018-12-18 |
| 9934336 | Method of correcting electron proximity effects using Voigt type scattering functions | Jean-Herve Tortai, Patrick J. Schiavone, Nader JEDIDI | 2018-04-03 |