Issued Patents 2018
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10054551 | Inspection system and method for inspecting a sample by using a plurality of spaced apart beams | Ron Naftali | 2018-08-21 |
| 9958670 | Scanning system and method for scanning an object | Ron Naftail, Rami Elichai | 2018-05-01 |