Issued Patents 2018
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10103288 | Transfer chamber metrology for improved device yield | David P. Bour, Alexey Goder | 2018-10-16 |
AD
Alain Duboust
Overall (2018): #495,625 of 503,207Top 100%
1
Patents 2018