Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10156532 | System and method for detecting a defective sample | — | 2018-12-18 |
| 9897561 | Method of detecting defects in an object based on active thermography and a system thereof | Khee Aik Christopher Lee | 2018-02-20 |