Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9684031 | Contact probe and semiconductor element socket provided with same | Katsumi Suzuki | 2017-06-20 |
| 9588140 | Inspection probe and an IC socket with the same | Katsumi Suzuki, Yuji Nakamura, Yukio Ota | 2017-03-07 |