Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9816942 | Device and method for inspecting semiconductor materials | Viviane Leguy | 2017-11-14 |
| 9739600 | Chromatic confocal device and method for 2D/3D inspection of an object such as a wafer | Gilles Fresquet, Alain Courteville | 2017-08-22 |