Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9733198 | Method and apparatus for improved sampling resolution in X-ray imaging systems | Tobias Funk, Chwen-yuan Ku, Josh Star-Lack, Edward G. Solomon, Winston Sun | 2017-08-15 |
| 9554767 | Method and apparatus for controlling X-ray exposure | Tobias Funk, Steve Denis Burion, Kate LeeAnn Bechtel, Joseph Anthony Heanue, Brian P. Wilfley | 2017-01-31 |