Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9804112 | Selective characterization of material under test (MUT) with electromagnetic impedance tomography and spectroscopy | Sarah E. Pluta, John W. Hewitt | 2017-10-31 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9804112 | Selective characterization of material under test (MUT) with electromagnetic impedance tomography and spectroscopy | Sarah E. Pluta, John W. Hewitt | 2017-10-31 |