Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9664733 | Probe device for testing electrical characteristics of semiconductor element | Yuichi Ozawa, Hiroshi Nishimura, Seiichi Ohta, Kunihiko Chiba, Ken Kato | 2017-05-30 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9664733 | Probe device for testing electrical characteristics of semiconductor element | Yuichi Ozawa, Hiroshi Nishimura, Seiichi Ohta, Kunihiko Chiba, Ken Kato | 2017-05-30 |