Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9797879 | Method for multiplexed sample analysis by photoionizing secondary sputtered neutrals | — | 2017-10-24 |
| 9766224 | Single cell analysis using secondary ion mass spectrometry | Garry P. Nolan, Sean C. Bendall | 2017-09-19 |