Issued Patents 2017
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9791505 | Full pad coverage boundary scan | Prakash Narayanan, Rajat Mehrotra | 2017-10-17 |
| 9772376 | Increase data transfer throughput by enabling dynamic JTAG test mode entry and sharing of all JTAG pins | Mudasir Shafat Kawoosa | 2017-09-26 |
| 9581645 | Test circuit providing different levels of concurrency among radio cores | Adesh Sontakke, Rubin Ajit Parekhji, Upendra Narayan Tripathi | 2017-02-28 |
| 9535123 | Frequency scaled segmented scan chain for integrated circuits | Wilson Pradeep, Vivek Singhal | 2017-01-03 |