Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9768245 | High breakdown voltage microelectronic device isolation structure with improved reliability | Thomas D. Bonifield, Byron Lovell Williams | 2017-09-19 |
| 9741787 | Methods and apparatus for high voltage integrated circuit capacitors | Thomas D. Bonifield, Byron Lovell Williams | 2017-08-22 |
| 9704804 | Oxidation resistant barrier metal process for semiconductor devices | Kezhakkedath R. Udayakumar, Eric H. Warninghoff, Alan G. Merriam, Rick A. Faust | 2017-07-11 |
| 9583558 | High breakdown voltage microelectronic device isolation structure with improved reliability | Thomas D. Bonifield, Byron Lovell Williams | 2017-02-28 |